Aspect Ratio Max. : 47
Layer Count Max. : 100
Pitch Min. : 0.32mm
WAFER TEST (CP)
晶圓測試(CP)
探針卡是測試機台與待測晶圓間相當重要的媒介工具，透過探針卡之探針(Probe)與晶圓上的銲墊(Pad)或凸塊(Bump)接觸後，將電性信號傳送到測試機台分析其功能與特性，判別晶粒的好壞，即透過電性量測的方式篩出不良品，減少切割後的不良品進入後段的封裝製程，降低IC 生產成本的浪費。
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- High temperature, up to 180℃
- High frequency, excellent RF test performance
- High current, up to 2,000 mA (single pin)
- Suitable for pitch 110 ~ 200 um
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- High temperature, up to 180℃
- High frequency, up to 112 Gbps
- High current, up to 2,000 mA (single pin)
- Suitable for pitch 80 ~ 200 um
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- High temperature, up to 180℃
- High frequency, up to 56 Gbps
- High current, up to 2,000 mA (single pin)
- Suitable for pitch 100 ~ 200 um
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- High temperature, up to 180℃
- High current, up to 1,300 mA (single pin)
- Suitable for pitch 45 ~ 100 um
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探針卡電路板
探針頭
Needle Type : MEMS
Needle Series : NS, BKS, BR, SS
Pin Count Max. : 50,000
Needle Series : NS, BKS, BR, SS
Pin Count Max. : 50,000
IC載板
C4 Pad Count Max. : 50,000 pin
C4 Pad Pitch : 50-200um
ST Type : AMLO, TFMLO
C4 Pad Pitch : 50-200um
ST Type : AMLO, TFMLO
探針卡電路板
Aspect Ratio Max. : 47
Layer Count Max. : 100
Pitch Min. : 0.32mm
Layer Count Max. : 100
Pitch Min. : 0.32mm
探針頭
Needle Type : MEMS
Needle Series : NS, BKS, BR, SS
Pin Count Max. : 50,000
Needle Series : NS, BKS, BR, SS
Pin Count Max. : 50,000
IC載板
C4 Pad Count Max. : 50,000 pin
C4 Pad Pitch : 50-200um
ST Type : AMLO, TFMLO
C4 Pad Pitch : 50-200um
ST Type : AMLO, TFMLO
